Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES) dataset

Name: Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES) dataset
Creator: YANG, DONGXUN; Tonouchi, Masayoshi
Published: 2025-05-13T00:00:00+08:00

Figshare2025-05-13 更新2026-04-08 收录

半导体表征

太赫兹光谱分析

数据链接：

https://figshare.com/articles/dataset/Figure_2_opju/29043638/2 数据链接链接失效反馈

官方服务：

资源简介：

The calculation dataset of Figure.2 in the titled journal paper: Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES)

提供机构：

YANG, DONGXUN; Tonouchi, Masayoshi

创建时间：

2025-05-13