光调制器芯片频率响应自校准高频测试技术验证数据

数据集的内容：光调制器芯片频率响应自校准高频测试技术验证数据, 包含1个数据集说明文件，1个数据文件。 采集方案：根据自校准测试方案，利用微波矢量网络分析仪采集光调制器芯片对应频率处的频率响应参数。 采集地点：电子科技大学清水河校区4号科研楼B区 采集时间：2021年5月14日 设备情况：Keysight N5225A 415.24KBDataset Content: High-frequency test technology verification data for frequency response self-calibration of optical modulator chips, including 1 dataset description document and 1 data file. Collection Scheme: According to the self-calibration test protocol, a microwave vector network analyzer was used to collect the frequency response parameters of the optical modulator chips at corresponding frequencies. Collection Location: Zone B, Building 4, Qingshuihe Campus, University of Electronic Science and Technology of China Collection Time: May 14, 2021 Equipment: Keysight N5225A File Size: 415.24 KB