Test of Neutron Effects On Low Power Devices
收藏B2FIND2026-04-25 收录
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Neutrons are the main source of secondary-radiation induced errors in VLSI at ground level and it is foreseen that the spread use of low power devices will exacerbate their...
在地面环境中，中子是诱发超大规模集成电路（Very Large Scale Integration，VLSI）产生次级辐射误差的主要来源；据预计，低功耗器件的普及应用将进一步加剧此类误差……
