遇见数据集

Muon-induced soft errors in advanced Flash Memories

收藏
B2FIND2026-04-25 收录
官方服务:

资源简介:

The feature size of Flash memories has been aggressively scaled. As a result, the memories built with this technology have the largest capacity in the semiconductor industry,...

二维码
社区交流群
二维码
科研交流群
商业服务